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dc.contributor.authorAlmessiere, M. A.
dc.contributor.authorÜnal, Bayram
dc.contributor.authorBaykal, A.
dc.contributor.authorErcan, I.
dc.date.accessioned2019-08-31T12:10:23Z
dc.date.accessioned2019-08-13T09:37:31Z
dc.date.available2019-08-31T12:10:23Z
dc.date.available2019-08-13T09:37:31Z
dc.date.issued2019en_US
dc.identifier.issn1574-1443
dc.identifier.issn1574-1451
dc.identifier.urihttp://dx.doi.org/10.1007/s10904-018-1010-9
dc.identifier.urihttps://hdl.handle.net/20.500.12436/911
dc.descriptionWOS: 000460952400011en_US
dc.description.abstractCe and Y substituted SrFe12O19 (x=0.4 and 0.5) nanohexaferrites have been synthesised by sol-gel auto-combustion. The pure hexagonal SrFe12O19 phase was confirmed by XRD, FE-SEM and HR-TEM. The ac conductivity and dielectric properties of Ce and Y substituted Sr:Fe12O19 nanohexaferrites were studied by using complex impedance technique. Dielectric properties such as dielectric constant, dielectric loss, dielectric tangent loss, as well as ac conductivity are measured at various bias potentials in a varying frequency range from 10Hz to 10MHz. The frequency dependency of the ac conductivity could be evaluated by a power exponent law at higher frequencies, which is a characteristic mechanism for electrical charge transport by tunnelling processes with which it is more dispersive at lower frequencies. The conduction mechanisms were also investigated at various dc bias potentials, mainly being an indicative of hopping type conduction. So, the dielectric dispersion behaviour can be well elucidated in terms of Maxwell-Wagner polarization in accordance with the Koop's phenomenological theory. Utilizing an electrical equivalent circuit model, impedance studies were carried out in a specific frequency domain to characterize all the contributions of the dielectric response between the grains and grain boundaries to the dielectric parameters.en_US
dc.description.sponsorshipDeanship of Scientific Research (DSR); Institute for Research and Medical Consultations (IRMC) of Imam Abdulrahman Bin Faisal University; King Abdullah University of Science and Technology (KAUST)en_US
dc.description.sponsorshipDr. A. Baykal thanks the Deanship of Scientific Research (DSR) and Institute for Research and Medical Consultations (IRMC) of Imam Abdulrahman Bin Faisal University for supporting this study. Dr. Munirah is grateful to the Core Lab teams of King Abdullah University of Science and Technology (KAUST) for providing the required analysis.en_US
dc.language.isoengen_US
dc.publisherSPRINGERen_US
dc.relation.ispartofJOURNAL OF INORGANIC AND ORGANOMETALLIC POLYMERS AND MATERIALSen_US
dc.identifier.doi10.1007/s10904-018-1010-9en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSr nanohexaferriteen_US
dc.subjectX-ray diffraction (XRD)en_US
dc.subjectConductivityen_US
dc.subjectDielectric lossen_US
dc.subjectElectric modulusen_US
dc.titleElectrical Properties of Cerium and Yttrium Co-substituted Strontium Nanohexaferritesen_US
dc.typearticleen_US
dc.authoridBayram Ünal |0000-0003-2025-9848
dc.departmentMühendislik ve Doğa Bilimleri Fakültesien_US
dc.identifier.volume29en_US
dc.identifier.issue2en_US
dc.identifier.startpage402en_US
dc.identifier.endpage415en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.institutionauthorÜnal, Bayram
dc.department-temp[Almessiere, M. A.] Imam Abdulrahman Bin Faisal Univ, Coll Sci, Dept Phys, POB 1982, Dammam 31441, Saudi Arabia; [Unal, B.] Istanbul Sabahattin Zaim Univ, Dept Software & Comp Engn, Halkali Cad 2, TR-34303 Istanbul, Turkey; [Almessiere, M. A.; Baykal, A.] Imam Abdulrahman Bin Faisal Univ, IRMC, Dept Nanomed Res, POB 1982, Dammam 31441, Saudi Arabia; [Ercan, I.] Imam Abdulrahman Bin Faisal Univ, IRMC, Dept Phys, POB 1982, Dammam 31441, Saudi Arabiaen_US


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